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scanning electron microscope

A small scanning electron microscope solution that combines automation and high performance is used to perform backscattered electron imaging on BiCaC

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A small scanning electron microscope solution that combines automation and high performance

Perform backscattered electron imaging on BiCaCo ceramic materials at a low voltage of 5kV to study the thermoelectric properties of this type of diamond salt material.

Using sample stage deceleration technology to achieve non gold spraying imaging of radiolarians at a landing voltage of 1kV. (Thank you to the University of Cambridge for providing samples)

Excellent low voltage performance, fully compatible with more samples that desktop electron microscopes cannot accommodate

Comprehensively surpassing the high-resolution imaging capability of desktop electron microscopes, obtaining unprecedented details

The minimum voltage of a desktop electron microscope can only reach 5kV, and its low voltage performance is very limited, making it unable to meet the detection needs of most small conductive samples. The Zeiss conventional tungsten filament scanning electron microscope has an acceleration voltage of 0.2-30kV and a beam current range of 0.5pA-5uA. Its low voltage performance far exceeds that of a desktop electron microscope, and it has a low vacuum mode, which is fully compatible with conductive samples, small conductive samples, electron beam irradiation sensitive samples, water containing or gas releasing samples, and other types of samples. It can simultaneously obtain sample electrode surface information, whether it is surface imaging or energy spectrum analysis, presenting unparalleled sharp sample surface and details to you.

Compared to desktop electron microscopes with a maximum resolution of 10-20 nm, Zeiss conventional tungsten filament scanning electron microscopes have a resolution of 3nm and a maximum magnification of 1000000 times, providing excellent imaging quality. They can accurately and clearly characterize and analyze nanoscale materials that cannot be observed and analyzed by desktop electron microscopes.

Associate the Zeiss conventional tungsten filament scanning electron microscope with Zeiss optical microscope, observe the same area on a small platform, and achieve multi-scale correlation analysis. By combining fluorescence, polarization, and spectroscopy, multi-dimensional and all-round characterization of samples can be achieved.

Large cavity design, large-scale imaging, covering areas that cannot be covered by desktop electron microscopes

Considering the diversity of sample sizes, the large cavity design of Zeiss conventional tungsten filament scanning electron microscope can accommodate samples with a maximum diameter of 200 mm, which is compatible with the vast majority of samples compared to desktop electron microscopes that can only accommodate samples with sizes of 30-100 mm.

Compared to desktop electron microscopes, which have a maximum field of view of only a few millimeters and require image stitching for high-resolution imaging in large fields, Zeiss conventional tungsten filament scanning electron microscopes have a maximum field of view of up to 20mm and a maximum size for a single image. Up to 3072X2304 pixels, directly for large-scale imaging

Abandoning the singularity of desktop electron microscopy and expanding the full characterization analysis platform

Compared to the singularity of desktop electron microscopes, Zeiss' conventional tungsten filament scanning electron microscope has reserved up to 8 interfaces in the cavity and provides a variety of detector options to ensure sufficient scalability, which can meet the detection needs of Xiaotong applications and show you the front

The contrast information of various levels such as morphology, composition, crystal orientation, etc. that have not been seen before, helps you comprehensively analyze your samples.

Thanks to its unique cavity design, the analysis working distance (AWD) of Zeiss conventional tungsten filament scanning electron microscope is 8.5 mm, ensuring a larger energy spectrum signal collection angle. Its signal collection efficiency is 1.5-2 times higher than traditional methods. Coupled with a high-sensitivity energy spectrum detector, it can achieve a counting rate of>30kCPS and the element detection range can be as low as Be coated elements. Compared to the desktop electron microscope with a counting rate of 10k+and a detection limit as low as B boron element, there is a qualitative leap in performance.

Intelligent and automated work, achieving ultimate efficiency

Zeiss conventional tungsten filament scanning electron microscope has an intelligent three-step workflow, which is far more intelligent and automated than desktop electron microscopes: image navigation sample selection intelligent automatic imaging. Help you gain a deeper understanding of the sample in the shortest possible time. At the same time, it makes daily imaging and spectral analysis work fast and simple, greatly improving work efficiency.

The SmartSEM touch, a simple and professional interactive interface designed specifically for Zeiss conventional tungsten filament scanning electron microscopes, provides an extremely simple, intuitive, and powerful user interface. It includes a series of exclusive Zeiss products

Easy to use, with interactive features. Junior users only need 20 minutes of training to easily get started with the operation.

Zeiss Conventional Tungsten Filament Scanning Electron Microscope

A small scanning electron microscope solution that combines automation and high performance

High performance spectral measurement

Zeiss conventional tungsten filament scanning electron microscope can easily obtain high counting rate energy spectrum detection results, and accurately analyze the elemental composition of samples. The energy spectrum analysis of particulate matter is shown in the figure.

Intelligent automation workflow

Through a simple 3-step intelligent automated workflow, you can efficiently obtain high-quality imaging results and gain a deep understanding of sample properties, eliminating all tedious operations. This is your efficient and powerful research assistant.

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