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Energy dispersive X-ray fluorescence analyzer
The FISCHERSCOPE X-RAY XUL and XULM series are the fundamental equipment in every electroplating workshop. The simple and easy-to-use energy dispersive X-ray fluorescence analyzer is very suitable for monitoring the composition of plating solutions, but it is also an indispensable helper in quality control: sturdy and durable, very suitable for measuring the plating layer on mass-produced parts such as nuts and bolts.
All X-ray spectrometers in the XUL/XULM series are easy to operate and intuitive. Larger samples can be easily manually placed in the measurement chamber; Alternatively, for smaller items such as plugs, the instrument can be equipped with a manual sample stage. Although the measuring equipment is compact, they provide enough space for your specimen - up to a height of 17 centimeters.
If you have multiple different measurement tasks, the X-ray XULM has interchangeable filters and collimators, so you can create measurement conditions for your application. In addition, XULM has a built-in micro focusing tube that can provide accurate results even in small measurement points and thin coatings.
characteristic：
Analyze plating solution and measure coating thickness using X-ray fluorescence method according to DIN ISO 3497 and ASTM B 568；
The minimum measurement point of XULM is about 0.1 mm; The minimum measurement point of XUL is about 0.5 mm；
Tungsten X-ray tube or tungsten micro focusing tube (XULM) as X-ray source;
Adopting a proportional receiver with proven short measurement time；
Collimator: fixed or 4 automatic switches；
Primary filter: fixed or 3 automatic switches；
Fixed sample stage or manual XY stage；
Camera for optical observation and measurement points；
Certified comprehensive protection design;
application：
Electroplated coatings, such as zinc on iron or zinc nickel on iron, are used for corrosion protection of mass-produced parts (nuts and bolts)；
Analysis of Metal Content in Electroplating Solution；
Decorative coating Cr/Ni/Cu/ABS；
Coatings on connectors and contacts in the electronics industry.
FISCHERSCOPE X-RAY XAN
Like the XUL series, FISCHERSCOPE ® X-ray XAN ® The instrument is suitable for analyzing samples with simple shapes. However, one major advantage of the XAN series is its semiconductor detectors. X-ray fluorescence can not only measure the thickness of coatings, but also analyze the composition of alloys (such as copper).
The XAN series includes a total of 5 desktop XRF spectrometers, covering a wide range of applications. XAN215 has an economically efficient PIN detector. Very suitable for simple coating thickness tasks, such as zinc coating on iron or Au/Ni/Cu. For more complex alloy or precious metal applications, we recommend using equipment with a silicon drift detector SDD (such as XAN220): due to its higher resolution, it can reliably distinguish between gold and platinum.
characteristic：
Universal X-ray fluorescence spectrometer for metal and precious metal analysis, coating thickness measurement, and RoHS screening according to DIN ISO 3497 and ASTM B 568 standards；
High end semiconductor detectors (PIN and SDD) ensure excellent detection accuracy and high resolution；
XAN 250 and 252: Used for measuring light elements such as aluminum, silicon, or sulfur;
Collimator: fixed or switchable, with a minimum measurement point of approximately 0.3mm
Basic filter: fixed or 6 switchable options
Fixed sample holder or manual XY stage
The camera can easily locate the optimal measurement position
The maximum height of the sample is 17 centimeters;
application：
Non destructive analysis of dental alloys, silver testing；
Multi layer coating testing；
Analysis of functional coatings with a thickness of 10nm or more in the electronics and semiconductor industries；
Trace analysis in consumer protection, such as testing lead content in toys；
Measuring metal alloy content according to the highest precision requirements of the jewelry industry and refineries.
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