Xi'an Sihai Analytical Instrument Co., Ltd
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WT-1200I/L minority carrier lifetime tester
WT-1200I/L minority carrier lifetime tester
Product details
Product Introduction
WT-1200IL is a single point testing technology for body life based on eddy current photoconductivity attenuation, mainly targeting non passivated silicon rods and silicon blocks.
Advantages&Overall Requirements
a) Rapid non-destructive testing
b) Compact structure and easy operation
c) Using a 1064nm infrared light source as the excitation source
d) Effectively eliminate the influence of surface recombination
e) There is a good correlation between μ - PCD and surface passivation samples
f) Suitable for high lifespan applications
g) Unique lifespan model to compensate for diffusion lifespan loss
h) The software has flexible calibration function, which facilitates necessary adjustments to the measurement results
i) Maintain good consistency between measuring the cross-section of the primary crystal rod and measuring the sample results after passivation process treatment
j) The life test results conform to the theoretical life decay trend of silicon rods based on the influence of oxygen defects (top) and metal defects
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