Product Features

Seebeck coefficient and resistivity measurements specifically for thin film materials.

The temperature range of the testing environment reaches 81K~700K.

Using dynamic method to measure Seebeck coefficient avoids systematic errors in temperature difference measurement caused by static measurement, resulting in more accurate measurements.

Measure resistivity using the four line method.

● Clamp design facilitates sample replacement and improves efficiency.

The software is easy to operate and intelligent enough to achieve fully automatic mode.