Thermo Scientific Scios 2 DualBeam is a high-resolution analysis system that provides excellent sample preparation and 3D characterization performance for a wide range of sample types, including magnetic and non-conductive materials. The Scios 2 DualBeam system features optimized sample processing capabilities, analytical accuracy, and usability, making it an ideal solution for scientists and engineers to conduct research and analysis in academic and industrial environments.

Scios 2 DualBeam can quickly and easily locate and prepare high-resolution S/TEM samples of various materials. The system is equipped with Thermo Scientific Auto Slice&View software, which can collect various 3D information with high quality and full automation. Whether obtaining structural information at 30kV in STEM mode or obtaining uncharged information from the sample surface at lower energy, the system can provide excellent nanoscale details under a wide range of working conditions. Scios 2 DualBeam can help users of all experience levels quickly and easily obtain high-quality, reproducible results. In addition, the system is designed specifically for challenging material micro characterization needs in materials science and is equipped with a fully integrated, extremely fast MEMS hot stage for sample characterization under working conditions close to real-world environments.

Source of emission: High stability Schottky field emission electron gun

Resolution:
☆ Very good working distance
☆ 30 keV下 STEM 0.8 nm
☆ 1 keV下1.6 nm
Electron beam deceleration mode at 1.4 nm at 1 keV

Electron beam parameters:
☆ Probe current range: 1 pA~400 nA
☆ Acceleration voltage range: 200 V~30 kV
☆ Landing voltage range: 20 eV~30 keV
☆ Large horizontal field of view width: 3 mm at 7 mm WD and 7.0 nm at 60 mm WD
☆ Navigation montage function, which can additionally increase the field of view width

Ionic Optics:
Large beam Sidewinder ion tube
Acceleration voltage range: 500 V~30 kV
Ion beam current range: 1.5 pA~65 nA
15 hole aperture
Standard non-conductive sample drift suppression mode
The ion source has a lifespan of at least 1000 hours
Ion beam resolution of 3.0 nm at 30 kV

Sample Room:
The coincidence point of electron beam and ion beam is at the analysis working distance (SEM 7 mm)
☆ Ports: 21
☆ Inner width: 379 mm

Sample stand: Flexible five axis electric sample stand
☆ XY range: 110 mm
☆ Z range: 65 mm
☆ Rotation: 360 ° continuous
☆ Tilt: -15 °~+90 °
☆ XY repeatability accuracy: 3 μ m
☆ The largest sample size, with a diameter of 110 mm, can rotate completely along the X and Y axes
☆ Maximum sample height, with a distance of 85 mm from the optimal center point
☆ The largest sample weighs 5 kg (including sample holder)
☆ Concentric rotation and tilt

Sample holder:
☆ Standard multifunctional sample holder, directly installed on the sample table in a unique way, can accommodate 18 standard sample holders (φ 12mm), 3 pre tilted sample holders, 2 vertical and 2 pre tilted side row holders (38 ° and 90 °), sample installation does not require tools
Each optional measuring bracket can accommodate 6 S/TEM copper meshes
Various chips and customized sample holders can be provided upon request (optional)
Detector system: capable of synchronously detecting up to four types of signals
☆ Sample Room Secondary Electronic Detector ETD
☆ Backscattered electron detector T1 inside the tube
☆ Secondary electron detector T2 inside the tube
☆ Secondary electronic detector T3 inside the tube (optional)
☆ IR-CCD infrared camera (observing the height of the sample stage)
☆ Image navigation color optical camera Nav Cam+ ™
☆ High performance ion conversion and electronic detector ICE
☆ Scalable low-voltage, high contrast, segmented solid-state backscatter detector DBS
☆ Electron beam current measurement

Control system:
☆ 64 bit operating system, keyboard, optical mouse
☆ Image display: 24 inch LCD display, high display resolution 1920 × 1200
☆ Support user-defined GUI, capable of displaying four images in real-time simultaneously
☆ Local language support
Multi functional control board and Joystick joystick (optional)

Characteristics and Applications:
☆ Use Sidewinder HT ion tube to quickly and easily prepare high-quality, localized TEM and atomic probe samples;
The Thermo Scientific NICol electronic tube can perform high-resolution imaging, meeting the imaging needs of a wide range of types of samples;
Various integrated tube and pole shoe detectors collect high-quality, sharp, and uncharged images, providing complete sample information;
Optional ASV4 software can accurately locate the area of interest and obtain high-quality, multimodal internal and 3D information;
The highly flexible 110mm sample stage and built-in Thermo Scientific Nav Cam camera enable precise sample navigation;
Specialized DCFI drift suppression technology and Thermo Scientific SmartScan modes are used to achieve artifact free imaging and graphic processing;
Flexible DualBeam configuration optimizes solutions to meet specific application requirements.