High Accelerated Life Testing (HALT) is a process that uses a rapidly changing oscillation system between high and low temperatures to reveal design defects and deficiencies in electronic and mechanical components. The purpose of HALT is to identify the functionality and destructive limits of a product in the early stages of development, in order to optimize its reliability. HALT is not a qualified or unqualified test, but a tool to assist design engineers in improving product reliability. There is no pre-set limit, and the limit is determined by the product, gradually increasing stress until failure. During the test, the product needs to be monitored. HASS (Highly Accelerated Stress Screening) is a high acceleration stress screening performed on products after obtaining the operating or failure limit value through HALT testing, where the stress is lower than that of HALT testing.

Radio and Television Metrology has multiple HALT test chambers, all of which are imported Qualmark brand, capable of conducting Halt/Hass tests, including low-temperature step stress test, high-temperature step stress test, vibration step stress test, rapid thermal cycle test, and comprehensive stress test. During these test processes, working stresses such as product on/off, voltage offset, frequency pull offset, etc. are often accompanied.

Halt/Hass testing can be conducted for modules, communication terminals, components, and complete machines of electrical and electronic, instrumentation, automotive, and aerospace products.

GB/T 29309；

DKBA1141 "HALT Test Specification for Communication Products".