Thermo Fisher Scientific Helios 5 DualBeam features high-performance imaging and analysis capabilities across the Helios 5 product line. It is designed to meet the wide range of FIB-SEM usage needs of materials science researchers and engineers, even for challenging samples.

Helios 5 DualBeam redefines the standard for high-resolution imaging: material contrast, fast, simple, and accurate high-quality sample preparation for S/TEM imaging and atomic probe tomography (APT), as well as subsurface and 3D characterization. On the basis of the proven performance of the Helios DualBeam series, the Helios 5 DualBeam has been improved and optimized, all aimed at ensuring that the system operates in a manual or automatic workflow state.

Technical parameters of semiconductor industry:

Technical parameters of materials science industry:

More user-friendly:

Helios 5 is an easy-to-use DualBeam system for users of all experience levels. Operator training can be shortened from a few months to a few days, and its system design can help all operators achieve consistent and reproducible results on various applications.

Improved productivity:

The advanced automation features, reliability, and stability of Helios 5 and AutoTEM 5 software allow for unmanned or even nighttime operations, significantly improving sample preparation throughput.

Improving time and results:

Helios 5 DualBeam introduces fine image adjustment function FLASH technology. With the help of FLASH technology, you only need to perform simple mouse operations in the user interface, and the system can "real-time" eliminate astigmatism, center the lens, and focus the image. Automatic adjustment can significantly improve throughput, data quality, and simplify the acquisition of high-quality images. On average, FLASH technology can reduce the time required to obtain optimized images by 10 times.