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Fourier transform infrared spectrometer
Fourier transform infrared spectrometer
Product details

MG6030 Fourier Transform Infrared Spectrometer

Fourier transform infrared spectrometerIt is different from the principle of dispersive infrared spectroscopy, and is an infrared spectrometer developed based on the Fourier transform principle of interfered infrared light. It mainly consists of an infrared light source, a diaphragm, and an interferometerIt consists of a beam splitter, moving mirror, fixed mirror, sample chamber, detector, various infrared reflectors, laser, control circuit board, and power supply. It can perform qualitative and quantitative analysis on samples and is widely used in fields such as pharmaceuticals and chemical engineering, geology and mining, petroleum, coal, environmental protection, customs, gemstone identification, criminal investigation and identification.

Product Features

1. MKS MG6030 Fourier Transform Infrared Spectrometer, suitable for online gas analysis. It can continuously and quickly measure online, and detect any subtle changes in the target gas in the first time.

2. It can measure a mixture of up to 40% H2O.

3. Having a permanently stored spectral library eliminates the cost of purchasing standard gases and saves calibration time.

4. Provide self compensation for pressure and temperature.

5. The design of linear detectors and patented spectrometers eliminates the need for calibration of the instruments.

6. The instrument has self diagnostic function, simple human-machine interface, and easy operation.

7. Can simultaneously distinguish and analyze multiple gas components.

TECHNICAL INDEX

Testing TechnologyFourier Transform Infrared Spectroscopy

Can test gases or water vaporThe vast majority of molecules, except for nitrogen, oxygen, and hydrogen

Range: Concentration ranging from 10 ppb to 100%

Fourier transform infrared2102 Fourier Transform Infrared

spectral resolution: 0.5 - 128cm-1

scanning speedOnce per second at 0.5cm-1

Scan time: 1-300 seconds

infrared sourceSilicon carbide at 1200 ℃

Reference laser: Helium neon (15798.2cm-1)

detectorThermal Cooling MCT

clean(Purge) Pressure: Maximum 20PSI (1.5bar)

Spectral RoomPurge flow rate: 0.2 liters per minute, dry nitrogen or dry air with a dew point below -70 ℃ and no carbon dioxide

optical systemPurge flow rate: 0.2 liters per minute, dry nitrogen or dry air with a dew point below -70 ℃ and no carbon dioxide

Pressure sensorMKS Baratron Capacitive Thin Film Pressure Sensor

Purge connection: Swagelok quick connector

Computer requirementsMicrosoft Windows XP operating system, 1024 X 768 display

PortRJ-45 Cross Ethernet; RS232 model 6030

size: 445mm wide X 318mm high X 648mm deep

installCan be installed in a 19 inch standard cabinet

power supply: 220V,50/60hz,3A

weight: 50 kilograms

Sampling temperatureRoom temperature to 200 ℃ (depending on calibration temperature)

Sampling speed flow: 0.2-10 liters/minute

Sampling pressure: 0.01-4 atmospheres (depending on calibration pressure)

structureNickel plated aluminum,

joint1/4 inch Swagelok

Sampling pressure: 0.01-4 atmospheres (depending on calibration pressure)

The Conduit1/4 inch heated stainless steel

looking glassAluminum substrate nickel plate, gold-plated

window: ZnSe

O-ring: Kalrez


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