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Atomic force Raman spectroscopy
Atomic force Raman spectroscopy
Product details

XploRA Nano Atomic Force Raman Combined System

Detailed information:
By coupling the nanoscale high spatial resolution of AFM with Raman fingerprinting spectroscopy technology, physical properties and chemical structure testing can be achieved at high spatial resolution.

Product features:
AFM and Raman imaging in the same region
● Tip enhanced Raman spectroscopy (TERS)
AFM optical lever feedback laser automatic collimation
● It can provide both upper and lateral coupling optical paths, and can use X100 high NA objective lens to improve collection efficiency
High frequency scanning head, insensitive to environmental noise
AFM-Raman coupling configuration
HORIBA Scientific
Raman technology can be used in conjunction withScanning probe microscope(SPM)Coupling to build a powerful and flexible systemAFM-Raman platform. Researchers can adjust according to their expectationsAFM-Choose the appropriate instrument based on Raman working mode.
All configurations equipped with laser scanning technology can quickly image the laser reflection on the scanning probe or image hotspots based on the needle tip enhanced Raman scattering signal, thus accurately and reliably locating the laser
SPMOn the tip of the probe.
High throughput optical signal collection and detection hardware ensures fast scanning while collecting data from every pointSPMSignal and Raman spectroscopy.
AFM Raman and Tip Enhanced Raman Scattering (TERS)

Integrate all your requirements into a powerful system

The perfect solution we provide utilizes direct optical path coupling and optimizes it to achieve high throughput. This platform can perform atomic force microscopy(AFM)Near field optical technology(SNOM,NSOM)Scanning tunneling microscope(STM)Coupling confocal optical spectrometer (Raman and fluorescence imaging) into a multifunctional instrument to achieve needle tip enhanced Raman scattering(TERS)Or common point measurement.

Combining nanoimaging and chemical analysis

Confocal AFM and Raman imaging of single-layer, double-layer, and three-layer graphene

● AFMAnd otherSPMTechnology can provide morphology, mechanics, thermal energy, electromagnetic field, and near-field optical properties at the molecular level resolution.
Confocal Raman spectroscopy and imaging can provide detailed chemical information of nanomaterials at sub micron spatial resolution.
The unique platform for synchronous measurement helps you obtain reliable and highly overlapping images.
Combining high performance and ease of use,HORIBAIt will be based on your selectionSPMManufacturers provide a reliable and fully functional solution
Needle tip enhanced Raman spectroscopy(TERS)The optics, mechanics, and software have all been optimized and designedHORIBAWith decades of experience in Raman spectroscopy as technical support, you can confidently use this technology.

One tool with multiple possibilities: AFM Raman can help you improve efficiency

Quickly find nano objects
Due to the unique chemical properties of nanomaterials and their strong Raman peak signals, nanomaterials that are not visible under an optical microscope can be searched and located through ultra fast Raman imaging. After finding the sample, we can perform morphological, mechanical, electrical, and thermal analysis on the location of interest.

Cross validation of your data
Raman spectroscopy can confirm certain properties of materials, such as graphene, which has poor contrast in AFM morphology and is difficult to determine layer thickness. Raman spectroscopy can obtain the same information from another perspective. In addition, Raman spectroscopy provides more information about structure and defects, which can only be provided by AFM with atomic resolution.

● Obtain chemical information on nanostructures of interest
Sometimes obtaining only physical properties is not enough when characterizing nanostructures. High resolution Raman confocal imaging can provide detailed chemical composition information, which other SPM sensors cannot achieve.


exploreTERS(Needle tip enhanced Raman scattering) field
TERS(or nano Raman) can combine the advantages of two technologies: it can achieve spatial resolution as low as2nm(Generally low to10nm)Chemical specific Raman spectroscopy imaging. This technology can be used to characterize the transition from nanotubes toDNAWaiting for various samples.


Multiple optical configurationsHORIBAofAFM-The Raman platform supports multiple optical solutions:


Bottom coupling: for transparent samples

Top coupling: TERS for confocal Raman or tilted needle tips

Lateral coupling: the optimal solution for determining the TERS of opaque samples

Can provide multi port and side-by-side configuration

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